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Element Analyzer (XGT 1700 Series)
RoHS and ELV Analysis
XRF analysis is widely used for fast, non-destructive screening of manufacturing materials and parts for RoHS and ELV compliancy. The XGT systems offer high sensitivity analysis for the five restricted elements (lead, cadmium, mercury, chromium, bromine) with limits of detection below 5 ppm. The standard 1.2 mm analysis beam allows individual cables and components to be accurately analysed, without risk of false pass/fail results.